01
No optical path
No traditional slit, grating, or optical alignment needed. Simplified architecture for field reliability.
350-1050 nm · 1 nm resolution
Master The Light
Master The Harvest
Full-spectrum visibility from 350–1050 nm with 1 nm spectral resolution optimizes lighting strategy across every growth stage.
Core technology
New Spectral Technology
Unlike traditional spectrometers, XPAR uses a spectral sensing chip combined with advanced spectral reconstruction algorithms.
350 nm700 nm1050 nm
1 nmSpectral Resolution
350–1050 nmFull Range
<2% per yearLong-term drift
≥0.999Spectral Repeatability
02
Semiconductor chip
Built on advanced semiconductor spectral sensing technology. Compact, mass-producible, and cost-effective.
03
Extremely stable
High environmental tolerance with no drift over time. Maintains calibration integrity across temperature and humidity changes.
04
AI reconstruction
Advanced spectral reconstruction algorithms ensure reliable, repeatable measurement across varying light sources.
Products
Built for Every Stage
Portable spectral instruments for field validation, crop lighting audits, and professional research workflows.
X-100
Professional standard portable spectrometer for plant lighting
- Professional spectral measurement
- PPFD and PAR analysis
- Portable instrument design
FLAGSHIP
X-200
Advanced spectral analyzer for professional users
- Advanced spectral analysis tools
- Compact instrument design
- Extended data processing
- Research-level measurement workflow
Applications
Designed for the Horticulture Industry
Empowering professionals across the entire horticultural ecosystem with actionable spectral intelligence.
Greenhouse growers
Optimize light recipes for each crop stage with real-time spectral feedback.
Vertical farms
Map PAR distribution across multi-tier systems for uniform canopy coverage.
Lighting engineers
Validate LED fixture output against target spectra with 1 nm resolution data.
Agricultural researchers
Export high-resolution spectral datasets for photobiology studies and publications.
Calibration
Trusted Calibration System
Measurement reliability requires rigorous calibration.
XPAR devices are calibrated using a strict calibration process comparable to industry-standard systems. Every unit is issued a unique certificate mapped to its serial number.
NISTTraceable accuracy
+/-5%@ 75 degree zenith angle
SIGlobal standards
Relative Response to Photons
Flat spectral response from 350–1050 nm, maintaining ≥98% relative sensitivity across the full PAR and far-red range.